As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...
Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...
Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
The latest version of Mentor Graphics' TestKompress compression and ATPG generation tool brings significant enhancements in functionality and productivity. One of the most time-consuming aspects of ...
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