What if all the DFT verification on your next big chip could be completed before tape-out? This “shift-left” of DFT verification would eliminate the need for shortcuts in verification and allow for ...

Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...

Synopsys has announced DFT Compiler MAX, its next-generation DFT synthesis solution, offering 1-pass test data volume compression capabilities to address design and test challenges occurring in 130-nm ...

A series of design-for-test (DFT) and automatic pattern generation (ATPG) products leverage advanced test modeling for dramatic capacity and performance gains in Synopsys' DFT Compiler. The TetraMAX ...

Design for testability (DFT), a way to build testability into an integrated circuit (IC) at the design stage to lower testing costs and increase manufacturing yield, has been around for many years in ...

Synopsys has extended its DFT compiler tool allowing it to add built-in self test (BIST) circuitry to system-on-chip (SoC) designs. Registers added by the SoCBIST tool are not as extensive as full ...

SocBIST Delivers Identical Fault Coverage with 10 Times Reduction in Test Time and 400 Times Reduction in Data Volume Compared to Full Scan MOUNTAIN VIEW, Calif., September 30, 2002 - Synopsys, Inc.