Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...

A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

TSMC exposed the defect density (D0) of its N2 process technology relative to its predecessors at the same stage of development at its North American Technology Symposium this week. According to the ...

New research from China reveals that ultraviolet degradation in TOPCon solar cells is governed by interface-level physical ...

(Nanowerk News) Metal-organic framework (MOF) nanocrystals are hybrid materials, built from metal clusters and organic linkers with an almost unlimited number of possible combinations. Their ...

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...

Triply-twinned body-centred cubic lattices shift strut-scale deformation from bending to stretching, producing major gains in ...