JD Supra

Design Defect’s “Consumer Expectations” Test; When Is It Unavailable?

In Verrazono v. Gehl Company, et al., 50 Cal.App 5th 636, Plaintiff Gary Verrazono (“Plaintiff”) sued Defendant Gehl Company (“Defendant”) for negligence and strict product liability based on design ...
JD Supra

Fourth DCA Adopts Risk-Utility Test as the Standard for Some Design Defect Claims

Recently, the Florida Fourth District Court of Appeal opened the door to moving away from the consumer expectations test and adopting the risk-utility test for strict liability design defect claims ...
EDN

Test methods identify small delay defects

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...
Semiconductor Engineering

Standardizing Defect Coverage In Analog/Mixed Signal Test

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
Semiconductor Engineering

Integrating Design Verification To Approach Zero Defects

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...