Micro probes are generally used to check and test small pitch, high-density electronic devices, such as chips, wafers, or ball-grid arrays. Most conventional probes use long, thin cantilever springs ...

Add Yahoo as a preferred source to see more of our stories on Google. It took scientists just 0.9 megapascals of pressure to pierce a problem holding back the next wave of display technology. At ...

STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...

Leuven, Belgium. Imec and Cascade Microtech, a FormFactor company, have announced the successful development of a fully automatic system for pre-bond testing of advanced 3D chips. Pre-bond testing is ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

August 1, 2013. Cascade Microtech Inc. and imec have announced breakthroughs in probing stacked integrated circuits (3D-SICs), fueling an important growth engine for the semiconductor market. Through ...

The new product maintains the high performance proven with the current Micro Prober “MR502″/”MR612” model while reducing the test takt time, cutting the foot ...

One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

Aim-TTi has developed a current probe which is cable of measuring currents in PCB tracks. Measurement of current normally requires either the insertion of a shunt resistor, or for the conductor to be ...