Semiconductor Engineering

Meeting The Test Challenges Of Ultra-Wideband Chipsets

This article is adapted from a paper and presentation at SEMICON China, March 2023. Ultra-wideband (UWB) technology, as defined by IEEE 802.15.4 and 802.15.4z standards, enables short-range, low-power ...
Electronic Design

Special Report: Medical test challenges extend from simulation to compliance

Wearable, mobile, implantable, and home health devices as well as electronic components, circuit boards, and subassemblies incorporated into medical equipment used in clinical settings all present ...
Electronic Design

Next-Generation RF Device Test Performance Challenges

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...
EDN

Tips & Tricks: NIB–An enhanced environment for mobile device test

Fixed-mobile convergence (FMC) and emerging protocols are changing the landscape for mobile developers. They impact the feature sets and performance of BSC and BTS equipment to over-the-air ...
EDN

Agilent’s go/no-go tester streamlines mobile device testing

The N9360A mobile station tester from Agilent Technologies is a stand-alone one-box test set for mobile device testing in service and repair, manufacturing, and R&D applications. According to the ...