Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Where were you in 1996? Were you at the start of your career in the electrical industry or a seasoned expert in your prime? Regardless of where that year found you in your professional life, one thing ...