Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch high-current ...