For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

Scan technology now is standard practice for digital designs. Each sequential element, either a flip-flop or latch, is replaced by a scan cell. The scan cells function as typical sequential elements ...

Cosmo Tech announced that its Supply Chain Vulnerability Scan is now available on the SAP Store, arming SAP Integrated Business Planning software with an AI-Simulation add-on to deliver supply chain ...

Since its ratification in the early 1990s, the IEEE 1149.1 Boundary Scan (JTAG) specification has shown that a well-thought-out standard can be resilient, adaptive, and quite useful in applications ...