Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...
As device complexity grows and fabrication costs continue to fall, test is emerging as the largest expense in complex SOC (system-on-chip) IC manufacturing. At the same time, ICs continue to ...
September 11, 2013. Synopsys Inc. has announced the availability of its DesignWare STAR Hierarchical System, an automated hierarchical test solution for efficiently testing SoCs, including ...
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