Using Nanovea’s Mechanical Tester in indentation mode, with a cylindrical flat tip, it’s possible to obtain tensile-yield strength data that correspond directly to macro tensile data. Nanovea, a ...
Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
Design-for-manufacturing (DFM) methodologies have taken center stage in the drive to improve yields in nanometer designs. Various techniques targeted at both the initial design and the manufacturing ...
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