To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

For some time, engineers have followed the IEEE 1149.1 standard, also known as “boundary-scan,” to create test structures on pc boards and in complete systems. Unfortunately, once products leave a ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...

Richardson, Texas—A product called DFT Analyzer from ASSET InterTech, Inc., a maker of IEEE-1149.1/JTAG boundary-scan test and ISP (in-system programming) tools, promises to reduce manufacturing and ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...