Abstract: Data center becomes increasingly energy hungry which desperately requires highly efficient power conversion. Graphical processing units (GPUs) and high-bandwidth memory(HBM) demand a growing ...
Abstract: The sine-wave histogram test (SHT) is a prevalent method for characterizing the static linearity of analog-to-digital converters (ADCs). The normalized SHT (NSHT) algorithm has gained wide ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results